Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells

STEFAN TALU, NIKOLA PAPEZ, DINARA SOBOLA, PAVEL TOFEL

Abstract


This article is devoted to study of Atomic Force Microscopy (AFM) images of solar cells based on gallium arsenide (GaAs). Mathematical processing of data involves obtaining additional information about topography. The analysis was carried out using AFM data for GaAs solar cells, before and after temperature treatment. The state of the surface affects the reflectivity, so the structuring of the surface is of particular interest. Optimized textures are needed to improve the optical properties of surfaces. Fractal analysis allows quantifying the condition of the morphology of the surface on the basis of AFM data.

Keywords


Atomic Force Microscopy, Fractal dimension, Temperature stress, Topography


DOI
10.12783/dteees/epee2017/18173

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