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Analysis on Thickness Dependence of Jc Caused by Dislocations and Grain Boundaries in YBCO Superconducting Films

Z. LEI, J. DING, P. WENG, X. CAI

Abstract


A parallel connection model for thickness dependence of Jc caused by dislocations and grain boundaries in YBCO superconducting films is established. Several expressions are deduced to describe the distribution of dislocation and grain boundary.Two extreme conditions are discussed, which involves the drastic drop in Jc caused totally by grain boundary and the drop in Jc not caused by grain boundary. Combining the experiment and analysis results, it is obtained the quantitative relation with thickness dependence of Jc and dislocations and grain boundaries

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